terms:scanning_electron_microscope
SEM. A type of electron microscope in which a fine beam of electrons systematically sweeps over the specimen to be examined. The intensity of the secondary electrons generated at the point of impact of the beam on the specimen is measured, and the resulting signal is fed into a cathode-ray-tube display which is scanned in synchronism with the scanning of the specimen.
terms/scanning_electron_microscope.txt · Last modified: 2023/11/22 08:42 by 127.0.0.1